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New Product Launches:
XSW-320 Gated

The XSW-320 Gated SWIR OEM module operates in the 0.9 to 1.7 μm spectral band and provides extremely short integration times (down to 100 ns). Its InGaAs detector has a resolution of 320 x 256 pixels and a pixel pitch of 20 µm.

A special feature of the XSW-320 Gated is the programmable trigger-out delay between the internally generated trigger-out pulse and the start of integration. The exposure time of the sensor is configurable from 100 ns up to 1 ms in steps of 100 ns, or 1 ms to 40 ms (standard mode).

 

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